Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Dino Lite MS15X-S2 XY/Rotation Base with C-Clamp - Designed for
MS15X-S1 is a multifunctional X/Y fine adjustment base designed for precise adjustment under Dino-Lite microscopes. The included rotating table connects directly to the top plate of the X/Y stage, allowing for simple rotation of the viewing subject. The precision machine crafted components provide for smooth movements and adjustments in positions with the knurled rotation knobs. The travel on the XY Base is as follows: X-axis allows for 1.5″ and the Y axis allows for 1.25″ of movement. Travel Area: X:1.5″ / Y:1.25″ X/Y Table Size: 3.25" x 4.25" It can be conveniently attached to compatible stands with the use of C-Clamps or the MS15X-P4 Clamp that are included in the packaging. Compatible stands: RK-10A, RK-06A, MS35B, MS37B, MS45BX-D2
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1/2" Head with 8 mm Pin, Aluminum, 1/8" Pin diameter
Slotted head pin stub mounts with tappered pin ends are for use with Cambridge, Phillips, Camscan, B&L, Etec, Zeiss. Made from ultra-pure aluminum with standard lathe finish.
Head: 1/2"
Pin height: 8 mm
Pin diameter: 1/8"
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1/2" Head with 8 mm Pin, Aluminum, 1/8" Pin diameter
Slotted head pin stub mounts with tappered pin ends are for use with Cambridge, Phillips, Camscan, B&L, Etec, Zeiss. Made from ultra-pure aluminum polished finish with a smooth and luster surface.
Head: 1/2"
Pin height: 8 mm
Pin diameter: 1/8"
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1/2" Head with 8 mm Pin, Carbon, 1/8" Pin diameter
Slotted head pin stub mounts with tappered pin ends are for use with Cambridge, Phillips, Camscan, B&L, Etec, Zeiss. Made from spectroscopically pure carbon.
Head: 1/2"
Pin height: 8 mm
Pin diameter: 1/8"
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1/2" Head with 8 mm Pin, Aluminum, 1/8" Pin diameter
Slotted head pin stub mounts with tappered pin ends are for use with Cambridge, Phillips, Camscan, B&L, Etec, Zeiss. Made from ultra-pure aluminum with standard lathe finish.
Head: 1/2"
Pin height: 8 mm
Pin diameter: 1/8"
Ace Glass, Inc. Reflector assembly only, order reflector adapted lamps separately
Reflector assembly only, order reflector adapted lamps separately
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/4-4C, 400 mesh, Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 4.0 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences Indexed Grid Graticle NE34A, 16 mm, 1 x 1 mm with 1.0 mm pitch
Useful for particle counting, particularly when reference is needed between workers. Also, they are useful for area of specimen determinations. Indexed grid marked 1-10 and A-J.
Size: 16 mm
Divisions: 1 x 1 mm with 1.0 mm pitch
Surface: Chrome image
Electron Microscopy Sciences MAC Custom Block of 10 Microanalysis Standards
Pure metal and compounds standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. The standards are polished to a 0.25 micron diamond finish and carbon coated and are supplied with fully authenticated certificates of analyses and a location map for standard identification.
A Faraday Cup, for accurate specimen current measurements is available as an optional extra on all mounts. The standards are mounted in brass holders.
Electron Microscopy Sciences EMS Tungsten Loop Filament New, JEOL K-Type
Our Electron microscope Tungsten filaments have a rigid attachment of the filament wire to the post with no possiblity of waving and a minimum tip radius for a coherent beam. The base assembly of all of our new filaments are guaranteed to be rebuildable for the lifetime of the electron beam instrument. Inspected for consistent quality and performance before being shipped to you. Return the base and we will rebuild the filament.
Use: JEOL K-Type
Electron Microscopy Sciences Microscope Graticule NE1 Horizontal, 27 mm, 10 mm with 0.1 mm subdivisions
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 27 mm
Electron Microscopy Sciences Gilder Thin Bar Square 400 mesh Copper Grid
Thin Bar Grids have been developed using a new technology to produce ultra-fine grids with thinner cross bars than regular grids. The result is equally firm specimen support but with 40% more open area for viewing maximum specimen surface area. 3.05 diameter, 0.8 mil thickness.
Grid: Copper
Pitch: 62 µm
Hole: 54 µm
Bar: 8 µm
:
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/2-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 2.0 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences Calibration Specimen PT, 15 mm steel disk for AFM
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. AFM Phase imaging, PT, pattern: random hard & soft domain as small as 10 nm, nominal pitch: none, material: polymer.
Electron Microscopy Sciences R 1.2/1.3 Holey Carbon Films on Grids, Grid: Gold. Mesh: 300., 100/PK
QUANTIFOIL is a perforated support foil with pre-defined hole size, shape and arrangement that has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) when compared with conventional holey film. QUANTIFOIL with circular holes is used in cryo-electron tomographic reconstruction. The roundness of the holes is advantageous with respect to the formation of an ice layer of constant thickness. A foil with ~1.2 µm circular holes and a spacing of ~1.3 µm between the holes. Smaller holes are designed for magnifications of 50,000x or higher.